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Laboratoire XLIM UMR CNRS 7252 Bât. H1 - SP2MI 11 Bd Marie et Pierre Curie TSA 41123 86073 Poitiers Cedex 9 GPS : 86360 Futuroscope Chasseneuil |
[3] Combined Statistical-Fractal Wavelet signatures for Texture Recognition
Mourougaya F., Carré P., Fernandez-Maloigne C.
Wavelet Applications in Industrial Processing IV - October 2006
[2] A new wavelet sub-band characterization for texture recognition
Mourougaya F., Carré P., Fernandez-Maloigne C.
Wavelet Applications in Industrial Processing III - Octobre 2005
[1] Wavelets Texture Features: A New Method for Sub-band Characterization
Mourougaya F., Carré P., Fernandez-Maloigne C.
Proceedings of IEEE International Conference on Image Processing 2005 - Septembre 2005
| Crédits et mentions légales | - Dernière mise à jour le 30 mars 2022 - |  |
